High Resolution X‐ray Diffraction and Imaging: physica status solidi (a): Vol 204, No 8

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In 2022, the youngest family member physica status solidi (RRL) – Rapid Research Letters is turning 15 years. To celebrate this milestone, we present a new virtual collection with invited articles.

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physica status solidi (a): Volume 204, Issue 8

Special Issue:High Resolution X‐ray Diffraction and Imaging

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Cover Picture

Real-time and in situ solidification of Al-based alloys investigated by synchrotron radiation: a unique experimental set-up combining radiography and topography techniques

Preface

Guest Editors' Introduction: Special issue on high resolution X-ray diffraction and imaging

Obituary

Gerhard Borrmann (1908–2006) and Gerhard Hildebrandt (1922–2005): their life stories and their contribution to the revival of dynamical theory in the 1950's

Original Papers

X-ray scattering

Determination of stacking fault densities in 3C-SiC crystals by diffuse X-ray scattering

Misfit dislocations in highly mismatched oxide interfaces, an X-ray diffraction study

Investigation by High Resolution X-ray Diffraction of the local strains induced in Si by periodic arrays of oxide filled trenches

Synchrotron X-ray Renninger scanning for studying strain in InAs/GaAs quantum dot system

High-temperature induced nano-crystal formation in ion beam-induced amorphous silicon ripples

X-ray diffraction peaks from misfit dislocations in double- and triple-crystal diffractometry

Structural anisotropy of InGaAs/GaAs(001) quantum dot chains structures

Anomalous scattering and isomorphous replacement in X-ray diffuse scattering holography

High-resolution X-ray diffraction study of CZ-grown GaAsP crystals

In-plane lattice parameter determination of Zn:LiNbO3 thin films epitaxially grown on x-cut LiNbO3 substrates using X-ray diffraction methods

Evolution of the microdefect structure in silicon on isothermal annealing as determined by X-ray diffractometry

High resolution X-ray diffraction analyses of ion-implanted GaN/AlN/Si heterostructures

Dynamical theory of X-ray diffraction by multilayered structures with microdefects

Wide angle X-ray dynamical diffraction by deformed crystals: recurrence relations

Characterization of InP porous layer by high-resolution X-ray diffraction

Grazing incidence X-ray scattering from epitaxial Fe/Au multilayers

A sensitive method for detecting long-range strain in nearly perfect crystals using X-ray dynamical diffraction

Defect structure of silicon crystals implanted with H2+ ions

Radiation-induced structural transformations in a silicon layer of SOI

Combined double- and triple-crystal X-ray diffractometry with account for real defect structures in all crystals of X-ray optical schemes

X-ray characterization of periodic sub-nm surface relief gratings

Oxidation as an assistant tool for structural analysis of inhomogeneous nanoscale InAs/AlAs(001) island system

X-ray imaging

White X-ray beam topography and radiography of Si1–x Gex crystals bonded to silicon

Determination of stress distribution in III–V single crystal layers for heterogeneous integration applications

Features of dislocation images reconstructed from step-scanned white X-ray section topographs

Characterization of dislocations in orthorhombic hen egg-white lysozyme crystals by synchrotron X-ray topography

Observation of interference fringes due to lattice distortion by resonant scattering X-ray topography

Pyroelectric-piezoelectric related enhancement of the domain contrast on topographs performed using a coherent X-ray beam in LiNbO3 at low temperature

Three-dimensional topography using an X-ray microbeam and novel slit technique

Structural changes in arsenic ion-implanted Hg1–x Cdx Te epitaxial layers

Real-time and in situ solidification of Al-based alloys investigated by synchrotron radiation: a unique experimental set-up combining radiography and topography techniques

Phase contrast X-ray imaging of large samples using an incoherent laboratory source

Hydrogen diffusion in titanium-hydride observed by the diffraction-enhanced X-ray imaging method

Analyzer-based X-ray phase contrast imaging with four bounce Si(444) monochromators at ELETTRA

Spatial resolution in Bragg-magnified X-ray images as determined by Fourier analysis

X-ray diffraction spot mapping – a tool to study structural properties of semiconductor disk laser devices

Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices

In-situ characterization during growth and processing

Thermal evolution of small N–D complexes in deuterated dilute nitrides revealed by in-situ high resolution X-ray diffraction

First order phase transition in MnAs nanodisks

Interface stability of magnetic tunnel barriers and electrodes

Real-time X-ray reflectometry during thin-film processing

A magnetron sputter deposition chamber for in-situ investigation of multilayer film growth using a state of the art Laboratory Diffractometer

In situ X-ray diffraction during MOCVD of III-nitrides

X-ray optics and instrumentation

Analysis of SR thermal load studied by FEA

Investigation of phase contrast hard X-ray microscopy using planar sets of refractive crossed linear parabolic lenses made from SU-8 polymer

Focusing high energy X-rays with stacked Fresnel zone plates

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In-plane lattice parameter determination of Zn:LiNbO₃ thin films epitaxially grown on x-cut LiNbO₃ substrates using X-ray diffraction methods

Defect structure of silicon crystals implanted with H₂⁺ ions

White X-ray beam topography and radiography of Si_1–xGe_x crystals bonded to silicon

Pyroelectric-piezoelectric related enhancement of the domain contrast on topographs performed using a coherent X-ray beam in LiNbO₃ at low temperature

Structural changes in arsenic ion-implanted Hg_1–xCd_xTe epitaxial layers