Volume 204, Issue 8 pp. 2804-2810
Original Paper

Analysis of SR thermal load studied by FEA

V. Áč

Corresponding Author

V. Áč

Department of Physics, Alexander Dubček University of Trenčín, Slovakia

Phone: +421 32 7400 213, Fax: +421 32 7400 213Search for more papers by this author
D. Korytár

D. Korytár

Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovakia

Search for more papers by this author
First published: 31 July 2007

Abstract

This work deals with analysis of the thermal effects and inherent mechanical deformations under absorption of the X-ray beam heat. The work is motivated by recent research concentrated on the development of optics for high-flux synchrotron radiation sources. We present the analyses of the static thermal load effects on the surface deformation field for a monocrystalline silicon target, which is the basic material for crystal X-ray optics. The surface and bulk thermal load induces the gradient of temperature and mechanical deformations of the target that are affecting the reflection and diffraction properties of the target. The paper presents the finite-element analyses (FEA) and simulation results of mechanical deformation of flat and slotted silicon targets. The hints for improved target geometry and physical limits for an actual cooling system can be obtained from the presented analyses. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.