Original Paper
X-ray diffraction spot mapping – a tool to study structural properties of semiconductor disk laser devices
Abstract
Local lattice plane curvature of semiconductor disk laser devices is determined by an X-ray spot mapping technique using white beam synchrotron radiation. This method allows for in-situ studies of the dependence of the lattice plane profile on device temperature and local heating by optical pumping. The influence of different device mounting procedures on the structural and optical device parameters was investigated. This knowledge was used for device technology optimisation. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
