Volume 204, Issue 8 pp. 2633-2637
Original Paper

A sensitive method for detecting long-range strain in nearly perfect crystals using X-ray dynamical diffraction

Takashi Saka

Corresponding Author

Takashi Saka

Daido Institute of Technology, 10-3 Takiharu-cho, Minami-ku, Nagoya 457-8530, Japan

Phone: +81 526126111, Fax: +81 6125623Search for more papers by this author
First published: 31 July 2007
Citations: 1

Abstract

A very sensitive method is proposed for the detection of long-range strain in otherwise perfect crystalline materials. In this method, the specimen is rotated around the scattering vector in the symmetrical Laue case. Long-range strains due to a uniform bending or torsion, that are not detectable with the symmetrical Laue condition, are sensitively detected by the proposed method of rotating the specimen. Several demonstrative topographic observations are presented. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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