Volume 204, Issue 8 pp. 2740-2745
Original Paper

Analyzer-based X-ray phase contrast imaging with four bounce Si(444) monochromators at ELETTRA

M. G. Hönnicke

Corresponding Author

M. G. Hönnicke

European Synchrotron Radiation Facility, BP 220, 38043 Grenoble, France

Departamento de Fisica, Universidade Federal do Parana, Caixa Postal 19091, 81531-990 Curitiba-PR, Brazil

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L. Rigon

L. Rigon

Dipartamento di Fisica, Universita di Trieste, Via Valerio 2, 34100 Trieste, Italy

Sincrotrone Trieste SCpA, Strada Statale S.S. 14 km 163.5, 34012 Basovizza, Italy

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F. Arfelli

F. Arfelli

Dipartamento di Fisica, Universita di Trieste, Via Valerio 2, 34100 Trieste, Italy

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R.-H. Menk

R.-H. Menk

Sincrotrone Trieste SCpA, Strada Statale S.S. 14 km 163.5, 34012 Basovizza, Italy

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C. Cusatis

C. Cusatis

Departamento de Fisica, Universidade Federal do Parana, Caixa Postal 19091, 81531-990 Curitiba-PR, Brazil

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First published: 31 July 2007
Citations: 3

Abstract

An analyzer-based X-ray phase contrast imaging setup (ABI) based on four bounce Si(444) monochromators at 18 keV mounted at the SYRMEP beamline at Elettra is presented. The system was stable for the employed exposure times. Contrasts, visibility of the object edges and signal to noise ratio of the acquired images were studied. Simulation procedures of the images were also exploited. The results show that such setup can be used for high sensitivity (high contrast) experiments at Elettra. Also, due to intrinsic properties, this setup can be useful for future ultra-small angle X-ray scattering experiments. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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