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Erbium Doped Fibre Amplifier Pumped Cr2+:ZnSe Laser
- Pages: R3-R5
- First Published: 14 December 2001
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Renormalization of the Optical Response of Semiconductors by Electron–Phonon Interaction
- Pages: 1209-1232
- First Published: 14 December 2001
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Theory for Modeling the Optical Properties of Surfaces
- Pages: 1233-1242
- First Published: 14 December 2001
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Many-Body Effects on the Electronic and Optical Properties of Bulk GaP
- Pages: 1261-1266
- First Published: 14 December 2001
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Ab initio Theory of Second Harmonic Generation from Semiconductor Surfaces and Interfaces
- Pages: 1267-1280
- First Published: 14 December 2001
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Electric and Magnetic Field Effects on Optical Properties of Excitons in Parabolic Quantum Wells and Quantum Dots
- Pages: 1281-1290
- First Published: 14 December 2001
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Eigenfunctions of the Inverse Dielectric Functions and Response Functions of Silicon and Argon
- Pages: 1291-1296
- First Published: 14 December 2001
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Raman Analysis of Ordered Organic Monolayers on Metal Surfaces
- Pages: 1297-1305
- First Published: 14 December 2001
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Optical Anisotropy of Organic Layers Deposited on Semiconductor Surfaces
- Pages: 1307-1317
- First Published: 14 December 2001
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FTIR Ellipsometry as a Tool for Studying Organic Layers: From Langmuir-Blodgett Films to Can Coatings
- Pages: 1319-1329
- First Published: 14 December 2001
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Spectroscopic Ellipsometry for Characterization and Monitoring of Organic Layers
- Pages: 1331-1338
- First Published: 14 December 2001
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A Reflectance Anisotropy Spectroscopy Investigation of Porphyrin Langmuir-Blodgett Films
- Pages: 1339-1344
- First Published: 14 December 2001
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Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
- Pages: 1353-1360
- First Published: 14 December 2001
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Optical Response of Low-Dimensional In Nanostructures Grown by Self-Assembly on Si Surfaces
- Pages: 1361-1369
- First Published: 14 December 2001
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Optical Second Harmonic Spectroscopy of Silicon Surfaces, Interfaces and Nanocrystals
- Pages: 1371-1381
- First Published: 14 December 2001
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Towards a Complete Many-Body Description: Optical Response of Real Surfaces
- Pages: 1383-1392
- First Published: 14 December 2001
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Polarizable-Bond Model for Surface Second-Harmonic Generation at Si(111):H (1 × 1)
- Pages: 1393-1400
- First Published: 14 December 2001
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GaAs(001): Surface Structure and Optical Properties
- Pages: 1401-1409
- First Published: 14 December 2001
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Reflectance Anisotropy Spectroscopy of Si(111)-(4 × 1)-In
- Pages: 1411-1416
- First Published: 14 December 2001
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Optical Investigation of the Clean and Oxidized In-Rich Surface of InAs(001)
- Pages: 1417-1421
- First Published: 14 December 2001
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In-situ Determination of the Carrier Concentration of (001) GaAs by Reflectance Anisotropy Spectroscopy
- Pages: 1423-1429
- First Published: 14 December 2001
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Near-Field Imaging of the Photocurrent Induced by Light on Boron-Implanted Silicon
- Pages: 1431-1442
- First Published: 14 December 2001
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The Potential of Reflection Anisotropy Spectroscopy as a Probe of Molecular Assembly on Metal Surfaces
- Pages: 1443-1453
- First Published: 14 December 2001
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Theory of First Layer and Single Molecule Surface Enhanced Raman Scattering (SERS)
- Pages: 1455-1470
- First Published: 14 December 2001
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Enhanced Infrared Absorption of SERS-Active Lines of Ethylene on Cu
- Pages: 1471-1476
- First Published: 14 December 2001
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Plasmon-Mediated Scattering of Light by Ion Eroded Ag(110) Surfaces
- Pages: 1477-1487
- First Published: 14 December 2001
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Sum Frequency Generation Study of CO Adsorption on Palladium Model Catalysts
- Pages: 1495-1503
- First Published: 14 December 2001
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Pd Deposition onto the Thermally Roughened Cu(110) Surface
- Pages: 1505-1512
- First Published: 14 December 2001
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Magnetization Induced Second Harmonic Generation from Ultrathin Metallic Multilayers
- Pages: 1513-1524
- First Published: 14 December 2001
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Ab initio Calculations of the Optical and Magnetooptical Properties of Bulk and Surface Layer Systems
- Pages: 1525-1536
- First Published: 14 December 2001
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Real Time Imaging of Surface Catalytic Reactions
- Pages: 1537-1548
- First Published: 14 December 2001
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Ellipsometric Investigations of the Refractive Index Depth Profile in PZT Thin Films
- Pages: 1549-1552
- First Published: 14 December 2001
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Materials Characterization in the Vacuum Ultraviolet with Variable Angle Spectroscopic Ellipsometry
- Pages: 1553-1562
- First Published: 14 December 2001
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Ellipsometry on Anisotropic Materials: Bragg Conditions and Phonons in Dielectric Helical Thin Films
- Pages: 1563-1575
- First Published: 14 December 2001
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Reflection Anisotropic Spectroscopy as a Tool in the Fabrication of Liquid Crystal Devices
- Pages: 1577-1581
- First Published: 14 December 2001