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Different Location of Photo- and Electroluminescence in n-Type Porous Silicon
- Pages: R1-R2
- First Published: 16 November 2001
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Formation and Theoretical Modeling of Non-Equilibrium Alloy Phases by Ion Mixing
- Pages: 3-33
- First Published: 16 November 2001
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The X-Ray Triple Crystal Diffractometry of Silicon Monocrystals with Ordered Dislocation Structure
- Pages: 35-43
- First Published: 16 November 2001
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The Morphology and Formation of Precipitates in Al–Ge Alloys
- Pages: 45-52
- First Published: 16 November 2001
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Effect of Magnetic Field on the Temperature Variation of Internal Friction Loss of Mn–Zn Spinel Ferrites in the Manganese-Rich Region
- Pages: 53-58
- First Published: 16 November 2001
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Estimation of Incubation Time for the Erasure Process in Phase Change Materials for Optical Memories
- Pages: 59-64
- First Published: 16 November 2001
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Effect of Superimposed Low Frequency Oscillations on the Static Creep Behaviour of Al–1 wt% Si and Al–1 wt% Si–0.1 wt% Zr–0.1 wt% Ti Alloys
- Pages: 65-74
- First Published: 16 November 2001
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Iron Silicide Formation by Precipitation in a Silicon Bicrystal
- Pages: 75-84
- First Published: 16 November 2001
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Resistivity Changes Due to Precipitation Effects in Fibre Reinforced Mg–Al–Zn–Mn Alloy
- Pages: 85-95
- First Published: 16 November 2001
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Study of Niobium Nitride Films Produced by DC Reactive Magnetron Sputtering
- Pages: 97-104
- First Published: 16 November 2001
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On the Photoelectric Properties of Thin Graded-Band-Gap Semiconductor Layers
- Pages: 105-110
- First Published: 16 November 2001
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Characterisation of the Interface States between Amorphous Diamond-Like Carbon Films and (100) Silicon
- Pages: 111-123
- First Published: 16 November 2001
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Influence of the Thickness of Titanium and Cobalt Layer on the Interface and Magnetization of Co/Ti Multilayers
- Pages: 125-131
- First Published: 16 November 2001
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Formation of GeSi Alloy at or near the Surface of Si Wafers for the Si/Ge/Si System by the Electron-Beam Doping Method
- Pages: 133-142
- First Published: 16 November 2001
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Effect of Hydrostatic Pressure on the Resistivity of n- and p-Type Polycrystalline InSb Thin Films
- Pages: 143-151
- First Published: 16 November 2001
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Aluminium Induced Crystallization of Amorphous Germanium
- Pages: 153-165
- First Published: 16 November 2001
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Investigations on Microstructure, Surface Topography, and Growth Process of Sputtered Molybdenum Showing Texture Turnover
- Pages: 167-184
- First Published: 16 November 2001
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Optical and Electrical Properties of CuAlSe2 Thin Films Obtained by Selenization of Cu/Al/Cu…Al/Cu Layers Sequentially Deposited
- Pages: 185-192
- First Published: 16 November 2001
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GIXS/AES Study of Polycrystalline Titanium and Titanium Oxide Films Sputtered on Si Substrate
- Pages: 193-199
- First Published: 16 November 2001
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Reactive Ion Etching of RuO2 Films: The Role of Additive Gases in O2 Discharge
- Pages: 201-215
- First Published: 16 November 2001
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Effect of the Initial Surface State of Silicon on Nucleation and Growth of Diamond CVD: An Investigation by Electron Spectroscopies
- Pages: 217-229
- First Published: 16 November 2001
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Intrinsic Gettering of Manganese Impurity in Silicon Substrate
- Pages: 231-235
- First Published: 16 November 2001
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Effect of Sodium on the Stationary Dark and Photoconductivity of Amorphous Ge30Se70
- Pages: 237-243
- First Published: 16 November 2001
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Effect of Oxygen Content on the Electrical Transport and Superconducting Properties of Pb0.5Sr2.5Y0.6Ca0.4Cu2O7—y
- Pages: 245-249
- First Published: 16 November 2001
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Magnetic Measurements of Critical Currents in Ag-BPSCCO Tapes: A Comparison
- Pages: 251-256
- First Published: 16 November 2001
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Perpendicular Magnetic Anisotropy in CoGd/Pd Multilayered Films
- Pages: 257-264
- First Published: 16 November 2001
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Relationship between Curie Temperature Enhancement and Volume Expansion Induced by Nitrogenation for PrFe12—xMox and Their Nitrides
- Pages: 265-270
- First Published: 16 November 2001
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Mössbauer Spectroscopy in Phase Determination of the Anisotropic Fe–Al–C Permanent Magnet
- Pages: 283-287
- First Published: 16 November 2001
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Characterization of Defect Levels in Doped and Undoped CuGaSe2 by Means of Photoluminescence Measurements
- Pages: 301-313
- First Published: 16 November 2001