Journal of Microscopy: Vol 239, No 2

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Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomography

Friction, adhesion and durability and influence of humidity on adhesion and surface charging of skin and various skin creams using atomic force microscopy

Photo- and bio-physical characterization of novel violet and near-infrared lipophilic fluorophores for neuronal tracing

ESEM imaging of dynamic biological processes: the closure of stomatal pores

Pixel-based analysis of FRAP data with a general initial bleaching profile

Using a <670> zone axis for convergent beam electron diffraction measurements of lattice strain in strained silicon

Texture classification by statistical learning from morphological image processing: application to metallic surfaces

Leakage radiation microscopy of surface plasmon coupled emission: investigation of gain-assisted propagation in an integrated plasmonic waveguide

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Journal of Microscopy: Volume 239, Issue 2

Co-registered spectrally encoded confocal microscopy and optical frequency domain imaging system

Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomography

Friction, adhesion and durability and influence of humidity on adhesion and surface charging of skin and various skin creams using atomic force microscopy

Photo- and bio-physical characterization of novel violet and near-infrared lipophilic fluorophores for neuronal tracing

ESEM imaging of dynamic biological processes: the closure of stomatal pores

Pixel-based analysis of FRAP data with a general initial bleaching profile

Using a <670> zone axis for convergent beam electron diffraction measurements of lattice strain in strained silicon

Texture classification by statistical learning from morphological image processing: application to metallic surfaces

Leakage radiation microscopy of surface plasmon coupled emission: investigation of gain-assisted propagation in an integrated plasmonic waveguide

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Journal of Microscopy

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Journal of Microscopy: Volume 239, Issue 2

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Co-registered spectrally encoded confocal microscopy and optical frequency domain imaging system

Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomography

Friction, adhesion and durability and influence of humidity on adhesion and surface charging of skin and various skin creams using atomic force microscopy

Photo- and bio-physical characterization of novel violet and near-infrared lipophilic fluorophores for neuronal tracing

ESEM imaging of dynamic biological processes: the closure of stomatal pores

Pixel-based analysis of FRAP data with a general initial bleaching profile

Using a <670> zone axis for convergent beam electron diffraction measurements of lattice strain in strained silicon

Texture classification by statistical learning from morphological image processing: application to metallic surfaces

Leakage radiation microscopy of surface plasmon coupled emission: investigation of gain-assisted propagation in an integrated plasmonic waveguide

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