Volume 28, Issue 4 pp. 1174-1177
research papers

Direct cross-sectional imaging using X-ray Compton scattering: application to commercial batteries

Naruki Tsuji

Naruki Tsuji

JASRI/SPring-8, 1-1-1 Kouto, Sayo, Hyogo, 679-5198 Japan

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Kentaro Kajiwara

Kentaro Kajiwara

JASRI/SPring-8, 1-1-1 Kouto, Sayo, Hyogo, 679-5198 Japan

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Masayoshi Itou

Masayoshi Itou

JASRI/SPring-8, 1-1-1 Kouto, Sayo, Hyogo, 679-5198 Japan

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Yoshiharu Sakurai

Corresponding Author

Yoshiharu Sakurai

JASRI/SPring-8, 1-1-1 Kouto, Sayo, Hyogo, 679-5198 Japan

Yoshiharu Sakurai, e-mail: [email protected]Search for more papers by this author
First published: 25 June 2021

Abstract

A synchrotron-based technique using Compton scattering imaging is presented. This technique has been applied to a coin battery (CR2023), and the cross-sectional image has been obtained in 34 ms without sample rotation. A three-dimensional image of the whole structure has been reconstructed from 74 cross-sectional images taken consecutively by scanning the incident, wide X-ray beam along one direction. This work demonstrates that quick cross-sectional imaging of regions of interest and three-dimensional image reconstruction without sample rotation are feasible using Compton scattering imaging.

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