Volume 21, Issue 24 2500026
Research Article

2D Semiconductors Directly Grown on Si with Room Temperature Mobility Exceeding 2000 cm2 V−1 s−1

Mengzhuan Lin

Mengzhuan Lin

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Luocheng Liao

Luocheng Liao

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Xiangtan, Hunan, 411105 China

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Dirui Wu

Dirui Wu

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Youna Huang

Youna Huang

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Jianxing Wu

Jianxing Wu

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Linkun Wang

Linkun Wang

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Wanting Xu

Wanting Xu

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Yuan Zhang

Yuan Zhang

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Jiahao Song

Jiahao Song

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Yingli Zhang

Yingli Zhang

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

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Changjian Li

Corresponding Author

Changjian Li

Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices, Southern University of Science and Technology, Shenzhen, Guangdong, 518055 China

E-mail: [email protected]

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First published: 27 April 2025

Abstract

Bi2O2Se has recently attracted immense interest in nanoelectronics and optoelectronics for its superior mobility, ferroelectric order, tunable bandgap, and exceptional air stability. However, until now, the direct growth of Bi2O2Se is limited to mica, or perovskite oxide substrates [SrTiO3, LaAlO3, (La, Sr)(Al, Ta)O3], incompatible with mainstream semiconductor processes, and the room temperature mobility is limited to ≈800 cm2 V−1 s−1. Here, the controllable growth of Bi2O2Se nanoflakes on SiO2/Si substrates is reported and with room temperature electron mobility higher than 2000 cm2 V−1 s−1, exceeding all previous reports. The unpreceded in-plane electron mobility is found to strongly correlate with the out-of-plane ferroelectric order, which is stabilized by the expanded c-lattice in oxygen-deficient Bi2O2Se. The stabilized ferroelectric phase is confirmed by piezoresponse force microscopy (PFM) and anisotropic transport property measurements, which generally possess a high dielectric constant, thus reducing the impurity scattering. The silicon-compatible ultrahigh mobility Bi2O2Se sheds light to high-performance electronic devices.

Conflict of Interest

The authors declare no conflict of interest.

Data Availability Statement

Research data are not shared.

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