High-Aspect-Ratio Imageable Top-Surface Lithography Using UV-Assisted Inkless Contact Printing
Graphical Abstract
The simple production of micro/nanoscale patterns with very high aspect ratios exceeding that of the mold used is demonstrated using unconventional top-surface lithography. The method combines inkless contact printing and subsequent dry pattern development by oxygen reactive ion etching (see image), making it possible to form high-resolution, high-aspect-ratio patterns without the aid of expensive optical protocols.