Volume 6, Issue 3 pp. 371-375
Communication

High-Aspect-Ratio Imageable Top-Surface Lithography Using UV-Assisted Inkless Contact Printing

Se-Jin Choi

Corresponding Author

Se-Jin Choi

Minuta Tech. Co., Ltd. R&D Center Seongnam, Gyeonggi-Do 513-15 (Korea)

Minuta Tech. Co., Ltd. R&D Center Seongnam, Gyeonggi-Do 513-15 (Korea).Search for more papers by this author
Jeong-Yong Park

Jeong-Yong Park

Semiconductor Division, Samsung Electronics Corporation Yougin, Gyeonggi-Do 446-711 (Korea)

Search for more papers by this author
First published: 27 January 2010
Citations: 5

Graphical Abstract

The simple production of micro/nanoscale patterns with very high aspect ratios exceeding that of the mold used is demonstrated using unconventional top-surface lithography. The method combines inkless contact printing and subsequent dry pattern development by oxygen reactive ion etching (see image), making it possible to form high-resolution, high-aspect-ratio patterns without the aid of expensive optical protocols.

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.