Volume 8, Issue 3 pp. 899-902
EMRS-I – Contributed Article

Analytical modelling and experimental verification of the three-dimensional current distribution on the top surface of silicon solar cells operating under concentrated sunlight

Maurizio Costagliola

Corresponding Author

Maurizio Costagliola

Department of Biomedical, Electronics and Telecommunications Engineering, University of Naples “Federico II”, via Claudio 21, 80125 Naples, Italy

Phone: +39 0817683126, Fax: +39 0815934448Search for more papers by this author
Michele Riccio

Michele Riccio

Department of Biomedical, Electronics and Telecommunications Engineering, University of Naples “Federico II”, via Claudio 21, 80125 Naples, Italy

Search for more papers by this author
Andrea Irace

Andrea Irace

Department of Biomedical, Electronics and Telecommunications Engineering, University of Naples “Federico II”, via Claudio 21, 80125 Naples, Italy

Search for more papers by this author
Gianluca Breglio

Gianluca Breglio

Department of Biomedical, Electronics and Telecommunications Engineering, University of Naples “Federico II”, via Claudio 21, 80125 Naples, Italy

Search for more papers by this author
Santolo Daliento

Santolo Daliento

Department of Biomedical, Electronics and Telecommunications Engineering, University of Naples “Federico II”, via Claudio 21, 80125 Naples, Italy

Search for more papers by this author
First published: 17 December 2010

Abstract

The approximation that the current is constant in any point of the emitter is not true for solar cells operating under concentrated sunlight. The transverse paths followed by photogenerated carriers to reach metal grid electrodes causes voltage drops leading to non-uniform distributed surface potential and a consequent reduction of the conversion efficiency. Moreover, concentrating lens often provide non-uniform light intensity thus worsening non-uniform current distribution. The correct design of surface geometry of the cell (metal grid, emitter depth, sheet resistance) should always take into account the above effects. Unfortunately a lack of reliable models still exists. In this paper we analytically solve the three-dimensional semiconductor equations with proper boundary conditions and taking into account, as source term, a distributed generation contribute. The reliability of the model has been tested by numerical simulations and experimentally verified with a lock-in thermography technique (© 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.