Volume 203, Issue 7 pp. 1712-1715
Original Paper

Fabrication of suspended GaN microstructures using GaN-on-patterned-silicon (GPS) technique

Z. Yang

Corresponding Author

Z. Yang

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

Phone: +852 23588530, Fax: +852 23581485Search for more papers by this author
R. N. Wang

R. N. Wang

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

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S. Jia

S. Jia

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

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D. Wang

D. Wang

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

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B. S. Zhang

B. S. Zhang

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

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K. M. Lau

K. M. Lau

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

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K. J. Chen

K. J. Chen

Department of Electrical & Electronic Engineering, Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong

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First published: 18 May 2006
Citations: 4

Abstract

We demonstrate a technique for fabricating suspended gallium nitride (GaN) microstructures without direct etching of GaN. The process combines a selective area growth of GaN-on-patterned-silicon substrate (GPS) and a subsequent sacrificial wet etching of the silicon under the GaN structures. Both anisotropic and isotropic wet etching techniques are used to carry out the sacrificial etching. The pattern-dependent lateral growth property of GaN growth is also discussed. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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