Volume 11, Issue 3 pp. 150-153

Graded-GaAs1−xPx bases in heterojunction bipolar transistors with InGaP emitters

Michio Ohkubo

Corresponding Author

Michio Ohkubo

Yokohama R & D Lab., The Furukawa Electric Co., Ltd., 2-4-3 Okano, Nishi-ku, Yokohama 220, Japan

Yokohama R & D Lab., The Furukawa Electric Co., Ltd., 2-4-3 Okano, Nishi-ku, Yokohama 220, JapanSearch for more papers by this author
Nariaki Ikeda

Nariaki Ikeda

Yokohama R & D Lab., The Furukawa Electric Co., Ltd., 2-4-3 Okano, Nishi-ku, Yokohama 220, Japan

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Takao Ninomiya

Takao Ninomiya

Yokohama R & D Lab., The Furukawa Electric Co., Ltd., 2-4-3 Okano, Nishi-ku, Yokohama 220, Japan

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Abstract

We have fabricated graded-GaAsP-base HBTs with InGaP emitters for the first time. Compared with the uniform-GaAs-base HBTs, current gain increased by a factor of 2 due to built-in field in the graded base. © 1996 John Wiley & Sons, Inc.

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