• Issue

    Journal of Applied Crystallography: Volume 36, Issue 2

    181-370
    April 2003
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research papers

Deconvolution of instrumental aberrations for synchrotron powder X-ray diffractometry

T. Ida,  H. Hibino,  H. Toraya, 
  • Pages: 181-187
  • First Published: 23 July 2004

A novel lattice-spacing comparator with resolution of 10−8

Xiaowei Zhang,  Hiroshi Sugiyama,  Masami Ando,  Yoshihiko Imai,  Yoshitaka Yoda, 
  • Pages: 188-192
  • First Published: 23 July 2004

A procedure towards the automatic solution of crystal structures by means of topological analysis of Fourier maps

Amador Menéndez-Velázquez,  Santiago García-Granda, 
  • Pages: 193-205
  • First Published: 23 July 2004

Multiple-data-set Rietveld analysis using isotopes in powder neutron diffraction. 2. Positional and anisotropic thermal displacement parameter determinations in CuO (tenorite) at 2 K and 300 K

Paul F. Henry,  Harriott Nowell,  Mark T. Weller,  Chick C. Wilson, 
  • Pages: 206-212
  • First Published: 23 July 2004

X-ray interferometer using wavefront division

Hiroshi Yamazaki,  Tetsuya Ishikawa, 
  • Pages: 213-219
  • First Published: 23 July 2004

An intensity evaluation method: EVAL-14

Albert J. M. Duisenberg,  Loes M. J. Kroon-Batenburg,  Antoine M. M. Schreurs, 
  • Pages: 220-229
  • First Published: 23 July 2004

Solution of organic crystal structures from powder diffraction by combining simulated annealing and direct methods

Angela Altomare,  Rocco Caliandro,  Carmelo Giacovazzo,  Anna Grazia Giuseppina Moliterni,  Rosanna Rizzi, 
  • Pages: 230-238
  • First Published: 23 July 2004

A Monte Carlo approach to crystal structure determination from powder diffraction data

V. Brodski,  R. Peschar,  H. Schenk, 
  • Pages: 239-243
  • First Published: 23 July 2004

Local structure at a ferrofluid surface: chain-like aggregates revealed by non-specular X-ray reflection

S. Doi,  I. Takahashi,  N. Tanaka, 
  • Pages: 244-248
  • First Published: 23 July 2004

A sensitive method to detect strain in silicon crystals using X-ray dynamical diffraction

Takashi Saka, 
  • Pages: 249-254
  • First Published: 23 July 2004

Analytical use of the stereographic Wulff net for single-crystal orientation for 1-, 2- and 3-rotated cuts

E. Michalski,  A. Majchrowski, 
  • Pages: 255-259
  • First Published: 23 July 2004

Phase transformation kinetic study and microstructure characterization of ball-milled m-ZrO2–10 mol% a-TiO2 by Rietveld method

H. Dutta,  S. K. Manik,  S. K. Pradhan, 
  • Pages: 260-268
  • First Published: 23 July 2004

A Michelson interferometer for X-rays capable of high-order measurement

Michael Nusshardt,  Ulrich Bonse, 
  • Pages: 269-279
  • First Published: 23 July 2004

Energetic materials: variable-temperature crystal structure of β-NTO

Nadezhda B. Bolotina,  Elizabeth Zhurova,  A. Alan Pinkerton, 
  • Pages: 280-285
  • First Published: 23 July 2004

Instrument line-profile synthesis in high-resolution synchrotron powder diffraction

O. Masson,  E. Dooryhée,  A. N. Fitch, 
  • Pages: 286-294
  • First Published: 23 July 2004

Automated profile analysis for single-crystal diffraction data

R. J. Angel, 
  • Pages: 295-300
  • First Published: 23 July 2004

Mixed valences in nanometric ferrites investigated by resonant powder diffraction

J. Lorimier,  F. Bernard,  J.-C. Niepce,  N. Guigue-Millot,  O. Isnard,  J.-F. Bérar, 
  • Pages: 301-307
  • First Published: 23 July 2004

A procedure for setting up high-throughput nanolitre crystallization experiments. I. Protocol design and validation

T. S. Walter,  J. Diprose,  J. Brown,  M. Pickford,  R. J. Owens,  D. I. Stuart,  K. Harlos, 
  • Pages: 308-314
  • First Published: 23 July 2004

A procedure for setting up high-throughput nanolitre crystallization experiments. II. Crystallization results

J. Brown,  T. S. Walter,  L. Carter,  N. G. A. Abrescia,  A. R. Aricescu,  T. D. Batuwangala,  L. E. Bird,  N. Brown,  P. P. Chamberlain,  S. J. Davis,  E. Dubinina,  J. Endicott,  J. A. Fennelly,  R. J. C. Gilbert,  M. Harkiolaki,  W.-C. Hon,  F. Kimberley,  C. A. Love,  E. J. Mancini,  R. Manso-Sancho,  C. E. Nichols,  R. A. Robinson,  G. C. Sutton,  N. Schueller,  M. C. Sleeman,  G. B. Stewart-Jones,  M. Vuong,  J. Welburn,  Z. Zhang,  D. K. Stammers,  R. J. Owens,  E. Y. Jones,  K. Harlos,  D. I. Stuart, 
  • Pages: 315-318
  • First Published: 23 July 2004

Reconstruction of grain boundaries in polycrystals by filtered back-projection of diffraction spots

Henning Friis Poulsen,  Soeren Schmidt, 
  • Pages: 319-325
  • First Published: 23 July 2004

Structural refinements of the individual grains within polycrystals and powders

S. Schmidt,  H. F. Poulsen,  G. B. M. Vaughan, 
  • Pages: 326-332
  • First Published: 23 July 2004

Resolution, truncation and smearing of the one-dimensional spin echo small-angle scattering instrument

Peng Yuan,  Jinkui Zhao, 
  • Pages: 333-337
  • First Published: 23 July 2004

Analysis of the small-angle intensity scattered by a porous and granular medium

O. Spalla,  S. Lyonnard,  F. Testard, 
  • Pages: 338-347
  • First Published: 23 July 2004

short communications

Large-angle convergent-beam setup for femtosecond X-ray crystallography

Davide Boschetto,  Christian Rischel,  I. Uschmann,  J. Perez,  S. Fourmaux,  D. Hulin,  E. Förster,  Antoine Rousse, 
  • Pages: 348-349
  • First Published: 23 July 2004

Easy editing of Protein Data Bank formatted files with EMACS

Charles S. Bond, 
  • Pages: 350-351
  • First Published: 23 July 2004

computer programs

Bulk-solvent correction for fast translation search in molecular replacement: service programs for AMoRe and CNS

Andrei Fokine,  Guido Capitani,  Markus G. Grütter,  Alexandre Urzhumtsev, 
  • Pages: 352-355
  • First Published: 23 July 2004

X-Cell: a novel indexing algorithm for routine tasks and difficult cases

Marcus A. Neumann, 
  • Pages: 356-365
  • First Published: 23 July 2004

laboratory notes

A 1300 K furnace for in situ X-ray microtomography

D. Bellet,  B. Gorges,  A. Dallery,  P. Bernard,  E. Pereiro,  J. Baruchel, 
  • Pages: 366-367
  • First Published: 23 July 2004

computer program abstracts

ISOMER-X: a program for the analysis of high-energy X-ray diffraction experiments

J. Urquidi,  C. J. Benmore,  J. Neuefeind,  B. Tomberli, 
  • Page: 368
  • First Published: 23 July 2004

book reviews

Free Access

Diffraction des rayons X sur chantillons polycristallins. By René Guinebretiere. Lavoisier: Hermes Science Publications, 2002. Pp. 286. Price EUR 70. ISBN 2-7462-0557-2.

Daniel Chateigner, 
  • Page: 369
  • First Published: 23 July 2004
Free Access

Orientation of single crystals by back-reflection Laue pattern simulation. By C. Marín & E. Diéguez. Singapore: World Scientific Publishing, 1999. Pp. xii + 164 + 3½″ floppy disk. USD 38, GBP 27. ISBN 981-02-2871-6.

Moreton Moore, 
  • Page: 370
  • First Published: 23 July 2004