Characterization of Materials

What's New

The second edition of Characterization of Materials adds completely new articles covering scanning probe techniques in recognition of their greatly improved and standardized instrumentation, the wide variety of physical phenomena exploited, and their entry into nearly every aspect of modern materials characterization.

• Porosity and Its Measurement, by Laura Espinal
• Handling Time and Temperature in Materials Simulation, by Mira Todorova
• Challenges to Structure Prediction and Structure Characterization at the Nanoscale, by Sharon C. Glotzer, Aaron S. Keys, and Eric Jankowski
• Characterizing Micro and Nanomaterials Using MEMS Technology , by Yoshitada Isono
• Impedance Spectroscopy of Dielectrics and Electronic Conductors, by Nikolaos Bonanos, Polycarpos Pissis, and J. Ross Macdonald
• Measuring the Electronic Properties of Materials at the Nanoscale, by Lincoln J. Lauhon
• Magneto-Optical Characterization of Magnetic Thin Films, Surfaces, and Interfaces, by Andrei Kirilyuk, Alexey V. Kimel, Matteo Savoini, and Theo Rasing
• Confocal Fluorescence Microscopy, by Oleg D. Lavrentovich
• Coherent Diffraction Imaging of Strain on the Nanoscale, by Ross Harder
• High-resolution 3D Imaging and Material Analysis with Transmission X-ray Microscopy and Nano-CT, by Yuxin Wang
• Spin Polarized Low-Energy Electron Microscopy, by Alpha N'Diaye and Adrian Quesada
• Electrostatic Force Microscopy and Kelvin Probe Force Microscopy, by Sascha Sadewasser and Clemens Barth
• Atomic Excitation Exploited by Energetic-Beam Characterization Methods, by Chris Jeynes and Geoffrey W. Grime