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VLSI Testing

Published Special Issues

First published: 1 January 1993

Last updated: 30 May 2024

This issue is now published.

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Article

Open Access

oa

Computer-Aided Testing Systems: Evaluation and Benchmark Circuits

Samiha Mourad, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Article

Open Access

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Coverage of Node Shorts Using Internal Access and Equivalence Classes

Warren H. Debany, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Article

Open Access

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Conditional Disconnection Probability in Star Graphs

Walid Najjar,  Pradip K. Srimani, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Research Article

Open Access

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Analysis and Design of Regular Structures for Robust Dynamic Fault Testability

Michael J. Bryan,  Srinivas Devadas,  Kurt Keutzer, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Article

Open Access

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Built-In Self-Test: Milestones and Challenges

Jacob Savir,  Paul H. Bardell, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Research Article

Open Access

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Theory, Analysis and Implementation of an On-Line BIST Technique

Rajiv Sharma,  Kewal K. Saluja, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Research Article

Open Access

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Overlapped Subarray Segmentation: An Efficient Test Method for Cellular Arrays

Earl E. Swartzlander,  Miroslaw Malek, 

• VLSI Design
• First Published: 01 January 1993

• Abstract
• PDF

Article

Open Access

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About the Editor in Chief and the Guest Editor

• VLSI Design
• First Published: 01 January 1993

• PDF

Research Article

Open Access

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Guest Editorial

Sunil R. Das, 

• VLSI Design
• First Published: 01 January 1993

• PDF

Article

Open Access

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Editorial

• VLSI Design
• First Published: 01 January 1993

• PDF