Volume 32, Issue 2pt3 pp. 335-344

Measurement-Based Synthesis of Facial Microgeometry

Paul Graham

Paul Graham

USC Institute for Creative Technologies, Los Angeles, CA, USA

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Borom Tunwattanapong

Borom Tunwattanapong

USC Institute for Creative Technologies, Los Angeles, CA, USA

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Jay Busch

Jay Busch

USC Institute for Creative Technologies, Los Angeles, CA, USA

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Xueming Yu

Xueming Yu

USC Institute for Creative Technologies, Los Angeles, CA, USA

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Andrew Jones

Andrew Jones

USC Institute for Creative Technologies, Los Angeles, CA, USA

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Paul Debevec

Paul Debevec

USC Institute for Creative Technologies, Los Angeles, CA, USA

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Abhijeet Ghosh

Abhijeet Ghosh

USC Institute for Creative Technologies, Los Angeles, CA, USA

Currently at Imperial College London

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First published: 06 May 2013
Citations: 31

Abstract

We present a technique for generating microstructure-level facial geometry by augmenting a mesostructure-level facial scan with detail synthesized from a set of exemplar skin patches scanned at much higher resolution. Additionally, we make point-source reflectance measurements of the skin patches to characterize the specular reflectance lobes at this smaller scale and analyze facial reflectance variation at both the mesostructure and microstructure scales. We digitize the exemplar patches with a polarization-based computational illumination technique which considers specular reflection and single scattering. The recorded microstructure patches can be used to synthesize full-facial microstructure detail for either the same subject or to a different subject. We show that the technique allows for greater realism in facial renderings including more accurate reproduction of skin's specular reflection effects.

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