Volume 206, Issue 8 pp. 1838-1841
Original Paper

Development of visualization method of grain boundaries in stainless steel by using white X-ray micro-beam and image detector

Kentaro Kajiwara

Corresponding Author

Kentaro Kajiwara

Industrial Application Division, Japan Synchrotron Radiation Research Institute, SPring-8, Sayo-cho, Hyogo 679-5198, Japan

Kentaro Kajiwara, Phone: +81 791 58 0924, Fax: +81 791 58 0988

Masugu Sato, Phone: +81 791 58 0924, Fax: +81 791 58 0988

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Masugu Sato

Corresponding Author

Masugu Sato

Industrial Application Division, Japan Synchrotron Radiation Research Institute, SPring-8, Sayo-cho, Hyogo 679-5198, Japan

Kentaro Kajiwara, Phone: +81 791 58 0924, Fax: +81 791 58 0988

Masugu Sato, Phone: +81 791 58 0924, Fax: +81 791 58 0988

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Tamotsu Hashimoto

Tamotsu Hashimoto

Industrial Application Division, Japan Synchrotron Radiation Research Institute, SPring-8, Sayo-cho, Hyogo 679-5198, Japan

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Ichiro Hirosawa

Ichiro Hirosawa

Industrial Application Division, Japan Synchrotron Radiation Research Institute, SPring-8, Sayo-cho, Hyogo 679-5198, Japan

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Takuyo Yamada

Takuyo Yamada

Institute of Nuclear Safety System, Incorporated, 64 Sata, Mihama-cho, Mikata-gun, Fukui 919-1205, Japan

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Takumi Terachi

Takumi Terachi

Institute of Nuclear Safety System, Incorporated, 64 Sata, Mihama-cho, Mikata-gun, Fukui 919-1205, Japan

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Takuya Fukumura

Takuya Fukumura

Institute of Nuclear Safety System, Incorporated, 64 Sata, Mihama-cho, Mikata-gun, Fukui 919-1205, Japan

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Koji Arioka

Koji Arioka

Institute of Nuclear Safety System, Incorporated, 64 Sata, Mihama-cho, Mikata-gun, Fukui 919-1205, Japan

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First published: 27 July 2009
Citations: 18

Abstract

A visualization method of grain boundaries in a polycrystal was developed at BL28B2 in SPring-8. By combining a scanning type white X-ray micro-diffraction system with high-energy synchrotron X-rays we non-destructively obtained images to visualize grain boundaries and grains in stainless steel by simple data processing. The images were comparable to those obtained by electron back scattering pattern technique. It was shown that the new method can be applied to bulky plate sample as thick as 300 µm containing grains with size of 100 µm.

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