Volume 206, Issue 8 pp. 1820-1824
Original Paper

X-ray section images of dislocations and dislocation barriers in Si

S. Novikov

S. Novikov

Chernivtsi National University, Kotsjubinskogo Str. 2, 58012 Chernivtsi, Russia

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I. Fodchuk

Corresponding Author

I. Fodchuk

Chernivtsi National University, Kotsjubinskogo Str. 2, 58012 Chernivtsi, Russia

Phone: +38 037 2244834, Fax: +38 037 2552914Search for more papers by this author
D. Fedortsov

D. Fedortsov

Chernivtsi National University, Kotsjubinskogo Str. 2, 58012 Chernivtsi, Russia

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A. Struk

A. Struk

Chernivtsi National University, Kotsjubinskogo Str. 2, 58012 Chernivtsi, Russia

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First published: 27 July 2009
Citations: 2

Abstract

By means of numerical solution of the Takagi equations, modeling of X-ray topographic images of deformation fields of the Lomer–Cottrell dislocation loops and dislocation barriers is made depending on their spatial location for the thin and thick crystals. Diffraction images created by dislocation loops and barriers of different size and spatial location are complicated and versatile in their thin structure.

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