Microwave and Optical Technology Letters

A reusable coplanar waveguide probe for in situ material characterization

Corresponding Author

Evan J. Everett

[email protected]

Department of Electrical and Computer Engineering, Rice University, Houston, TX 77005

Department of Electrical and Computer Engineering, Rice University, Houston, TX 77005Search for more papers by this author

Stuart M. Wentworth,

Stuart M. Wentworth

Department of Electrical and Computer Engineering, Auburn University, Auburn, AL 36849

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Benjamin T. Garrett,

Benjamin T. Garrett

Department of Electrical and Computer Engineering, Auburn University, Auburn, AL 36849

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Evan J. Everett,

Corresponding Author

Evan J. Everett

[email protected]

Department of Electrical and Computer Engineering, Rice University, Houston, TX 77005

Department of Electrical and Computer Engineering, Rice University, Houston, TX 77005Search for more papers by this author

Stuart M. Wentworth,

Stuart M. Wentworth

Department of Electrical and Computer Engineering, Auburn University, Auburn, AL 36849

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Benjamin T. Garrett,

Benjamin T. Garrett

Department of Electrical and Computer Engineering, Auburn University, Auburn, AL 36849

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First published: 19 August 2011

https://doi.org/10.1002/mop.26350

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Abstract

A novel reusable coplanar waveguide tee resonator probe is stenciled in a rigid sheet of brass. The probe can be easily placed on dielectric slabs for in situ permittivity measurement. The method can be applied to inhomogeneous materials that may not lend themselves to precise sample preparation or to open-ended coaxial probing. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:2601–2604, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26350

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Volume53, Issue11

November 2011

Pages 2601-2604

A reusable coplanar waveguide probe for in situ material characterization

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A reusable coplanar waveguide probe for in situ material characterization

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