Azimuthal Scanning Excitation Surface Plasmon Resonance Holographic Microscopy
Jiwei Zhang
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorShuqi Wang
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorWenrui Li
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorXiangyuan Luo
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorLingke Wang
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorJingyu Mi
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorJiazhen Dou
MOE Key Laboratory of Photonic Technology for Integrated Sensing and Communication, Guangdong Provincial Key Laboratory of Information Photonics Technology, Institute of Advanced Photonics Technology, School of Information Engineering, Guangdong University of Technology, Guangzhou, 510006 China
Search for more papers by this authorSiqing Dai
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorFanfan Lu
School of Artificial Intelligence, Optics and Electronics (iOPEN), Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorCorresponding Author
Peng Li
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
E-mail: [email protected]; [email protected]
Search for more papers by this authorCorresponding Author
Jianlin Zhao
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
E-mail: [email protected]; [email protected]
Search for more papers by this authorJiwei Zhang
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorShuqi Wang
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorWenrui Li
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorXiangyuan Luo
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorLingke Wang
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorJingyu Mi
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorJiazhen Dou
MOE Key Laboratory of Photonic Technology for Integrated Sensing and Communication, Guangdong Provincial Key Laboratory of Information Photonics Technology, Institute of Advanced Photonics Technology, School of Information Engineering, Guangdong University of Technology, Guangzhou, 510006 China
Search for more papers by this authorSiqing Dai
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorFanfan Lu
School of Artificial Intelligence, Optics and Electronics (iOPEN), Northwestern Polytechnical University, Xi'an, 710129 China
Search for more papers by this authorCorresponding Author
Peng Li
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
E-mail: [email protected]; [email protected]
Search for more papers by this authorCorresponding Author
Jianlin Zhao
Key Laboratory of Light Field Manipulation and Information Acquisition, Ministry of Industry and Information Technology, Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an, 710129 China
E-mail: [email protected]; [email protected]
Search for more papers by this authorAbstract
Surface plasmon resonance (SPR) holographic microscopy exploits surface plasmon wave as illumination and acquires both SPR intensity and phase images. It detects extremely tiny variations of weakly interacting objects owing to high sensitivity and has been applied in cell biology, material science, surface chemistry, etc. However, it is very challenging to solve the problem of poor spatial resolution due to the transverse propagation of surface plasmon wave. In this paper, an azimuthal scanning excitation method is proposed in SPR holographic microscopy to improve the spatial resolution by engineering the Fourier spectra of SPR images from dual-arc to circular shape. The study modulates the light field with spatial position, wavevector, and polarization to realize azimuthal scanning excitation of SPR. Systematic experiments of dielectric spheres, nanowires, two-dimension materials, and complex nanostructure are conducted to show the resolution improvement with one order of magnitude, the higher detection sensitivity of SPR phase than that of SPR intensity, and the necessities of both of high-resolution SPR intensity and phase images to retrieve sample information in certain scenarios. Benefiting from the high detection sensitivity and spatial resolution, the proposed microscopy will find wide applications in nanoparticle analysis, low-dimensional material characterization, and imaging extremely thin or transparent samples.
Conflict of Interest
The authors declare no conflict of interest.
Open Research
Data Availability Statement
The data that support the findings of this study are available from the corresponding author upon reasonable request.
Supporting Information
| Filename | Description |
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| lpor202301013-sup-0001-SuppMat.pdf1 MB | Supporting Information |
Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
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