Peak Force Infrared–Kelvin Probe Force Microscopy
Devon S. Jakob
Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015 USA
Search for more papers by this authorHaomin Wang
Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015 USA
Search for more papers by this authorDr. Guanghong Zeng
DFM A/S, Danish National Metrology Institute, Kogle Alle 5, 2970 Hørsholm, Denmark
Search for more papers by this authorDr. Daniel E. Otzen
Interdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wields Vej 14, 8000 Aarhus C, Denmark
Search for more papers by this authorDr. Yong Yan
Department of Chemistry, San Diego State University, 5500 Campanile Dr., San Diego, CA, 92182 USA
Search for more papers by this authorCorresponding Author
Dr. Xiaoji G. Xu
Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015 USA
Search for more papers by this authorDevon S. Jakob
Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015 USA
Search for more papers by this authorHaomin Wang
Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015 USA
Search for more papers by this authorDr. Guanghong Zeng
DFM A/S, Danish National Metrology Institute, Kogle Alle 5, 2970 Hørsholm, Denmark
Search for more papers by this authorDr. Daniel E. Otzen
Interdisciplinary Nanoscience Center (iNANO), Aarhus University, Gustav Wields Vej 14, 8000 Aarhus C, Denmark
Search for more papers by this authorDr. Yong Yan
Department of Chemistry, San Diego State University, 5500 Campanile Dr., San Diego, CA, 92182 USA
Search for more papers by this authorCorresponding Author
Dr. Xiaoji G. Xu
Department of Chemistry, Lehigh University, 6 E Packer Ave., Bethlehem, PA, 18015 USA
Search for more papers by this authorAbstract
Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared–Kelvin probe force microscopy (PFIR-KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single-pass scan. MAPbBr3 perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr3 near the boundary to PbBr2. PFIR-KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR-KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.
Conflict of interest
The authors declare no conflict of interest.
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