Volume 516, Issue 1-2 pp. 27-30
Original Paper

In situ synchrotron X-ray studies of PbTiO3 thin films

D.D. Fong

D.D. Fong

Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

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C. Thompson

C. Thompson

Department of Physics, Northern Illinois University, DeKalb, IL 60115, USA

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S.K. Streiffer

S.K. Streiffer

Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

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J.A. Eastman

J.A. Eastman

Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

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O. Auciello

O. Auciello

Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

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P.H. Fuoss

P.H. Fuoss

Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

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G.B. Stephenson

Corresponding Author

G.B. Stephenson

Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

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First published: 10 February 2004

Abstract

We have used in situ synchrotron x-ray scattering to investigate PbTiO3 films grown epitaxially on SrTiO3 (001) substrates. When the films are cooled below a thickness-dependent Curie temperature, the ferroelectric phase forms as 180° stripe domains with a well-defined period. With further cooling, the period changes fairly abruptly from a lower to a higher value, suggesting a transition between two stripe domain phases. The periods of both stripe phases are observed to depend on the square root of film thickness, in agreement with theory.

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