Volume 203, Issue 1 pp. 17-27
Research Article

Analysis of AC Conductivity Data of the Anion Excess Sr1 — xThxF2 + 2x Solid Solution with Fluorite-Type Structure

E. F. Hairetdinov

E. F. Hairetdinov

Institute for Solid State Chemistry, Russian Academy of Sciences, 630128 Novosibirsk 128, Russia

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N. F. Uvarov

N. F. Uvarov

Institute for Solid State Chemistry, Russian Academy of Sciences, 630128 Novosibirsk 128, Russia

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Y. J. Xu

Y. J. Xu

Institut de Chimie de la Matière Condensée de Bordeaux, Avenue du Docteur A. Schweitzer, F-33608-Pessac Cédex, France

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J. M. Reau

J. M. Reau

Institut de Chimie de la Matière Condensée de Bordeaux, Avenue du Docteur A. Schweitzer, F-33608-Pessac Cédex, France

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Abstract

Conductivity parameters, number of charge carriers, frequency of hopping, have been determined from an analysis of ac conductivity data of the Sr1 — xThxF2 + 2x (0 ≤ x ≤ 0.225) solid solution with fluorite-type structure. The charge carrier concentration has been estimated: (i) from the frequency dependence of conductivity, in accordance with the Almond-West approach; (ii) from the increment of the dielectric constant due to charge carriers. Similar results have been obtained by both approaches. The fraction of charge carriers per formula unit, evaluated as a function of composition, is in good agreement with the estimations made on the basis of the clustering process model which assumes that the charge carriers at long range in Sr1 — xThxF2 + 2x are interstitial fluoride ions of F′′′ type. For x > 0.05, the results have been interpreted by the additional presence of nn and nnn dipoles, the concentration and reorientation rate parameters of which have been evaluated.

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