Magnetic Media, Imaging

C. A. Ross

C. A. Ross

Massachusetts Institute of Technology, Cambridge, MA

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M. E. Schabes

M. E. Schabes

IBM Almaden Research Center, San Jose, CA

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T. Nolan

T. Nolan

Komag Inc., San Jose, CA

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K. Tang

K. Tang

IBM Research, San Jose, CA

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R. Ranjan

R. Ranjan

Seagate Magnetics, Fremont, CA

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R. Sinclair

R. Sinclair

Stanford University, Stanford, CA

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First published: 27 December 1999

Abstract

The sections in this article are

  • 1 Bitter Patterns
  • 2 Magnetooptical Kerr Effect
  • 3 Lorentz Transmission Electron Microscopy
  • 4 Scanning Electron Microscope–Based Techniques
  • 5 Electron Holography
  • 6 Magnetic Force Microscopy
  • 7 Conclusions

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.