Higher order full-wave analysis of multilayer microstrip structures
Abstract
A higher order method of moments is presented for the analysis of microstrip structures in a multilayer medium. It is shown that this higher order method has a better convergence rate than the conventional lower order methods. Therefore, to achieve the same accuracy, the higher order method requires fewer unknowns. Several examples are given to demonstrate the accuracy and efficiency of this method. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 141–145, 2000.