Volume 59, Issue 11 pp. 1677-1681
Article

Effect of physical and chemical modifications on microcrystalline parameters of silk fibers

H. Somashekarappa

H. Somashekarappa

Department of Physics, Yuvaraja's College, Mysore-570 005, India

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N. Selvakumar

N. Selvakumar

Department of Textile Technology, Anna University, Madras-600 025, India

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V. Subramaniam

Corresponding Author

V. Subramaniam

Department of Textile Technology, Anna University, Madras-600 025, India

Department of Textile Technology, Anna University, Madras-600 025, India===Search for more papers by this author
R. Somashekar

R. Somashekar

Department of Studies in Physics, University of Mysore, Mysore-570 006, India

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Abstract

Wide-angle X-ray diffraction studies of physically and chemically treated silk fibers like bivoltine mulberry silk and tassar silk were carried out to evaluate their crystal size, lattice distortion, and minimum enthalpy, as these determine the properties of silk fibers. The results are also compared with tenacity measurement. © 1996 John Wiley & Sons, Inc.

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