Volume 56, Issue 5 pp. 1426-1434
research papers

Strain generated by the stacking faults in epitaxial SrO(SrTiO3)N Ruddlesden–Popper structures

Guillaume Saint-Girons

Corresponding Author

Guillaume Saint-Girons

French National Centre for Scientific Research, INL-UMR5270/CNRS-Ecole Centrale de Lyon, 36 avenue Guy de Collongue, Lyon, Ecully, 69134 France

Guillaume Saint-Girons, e-mail: [email protected]Search for more papers by this author
Clarisse Furgeaud

Clarisse Furgeaud

French National Centre for Scientific Research, INL-UMR5270/CNRS-Ecole Centrale de Lyon, 36 avenue Guy de Collongue, Lyon, Ecully, 69134 France

Search for more papers by this author
Ludovic Largeau

Ludovic Largeau

Université Paris-Saclay, C2N/CNRS, Palaiseau, 91120 France

Search for more papers by this author
Alexandre Danescu

Alexandre Danescu

French National Centre for Scientific Research, INL-UMR5270/CNRS-Ecole Centrale de Lyon, 36 avenue Guy de Collongue, Lyon, Ecully, 69134 France

Search for more papers by this author
Romain Bachelet

Romain Bachelet

French National Centre for Scientific Research, INL-UMR5270/CNRS-Ecole Centrale de Lyon, 36 avenue Guy de Collongue, Lyon, Ecully, 69134 France

Search for more papers by this author
Mohamed Bouras

Mohamed Bouras

French National Centre for Scientific Research, INL-UMR5270/CNRS-Ecole Centrale de Lyon, 36 avenue Guy de Collongue, Lyon, Ecully, 69134 France

CNRS/UVSQ, GEMAC, 45 avenue des Etats Unis, Bat. Fermat, Versailles, 78035 France

Search for more papers by this author
First published: 01 September 2023

Abstract

Ruddlesden–Popper (RP) phases present outstanding physical properties triggering significant academic interest. Out-of-plane stacking faults (OP-SFs), which are the main channel for accommodating stoichiometry imbalance in RP thin layers, affect these properties. The mechanisms underlying the formation and spatial distribution of these defects remain largely unknown to date. This work shows that the residual mismatch related to the presence of OP-SFs in SrTiO3-based RP thin layers is accommodated by a delocalized mechanism of lateral strain transfer from the disturbed regions to the RP structure, generating a distribution of compressive strain in the latter. Analysing the RP X-ray diffractograms in the light of this mechanism allows the assessment of the OP-SF distribution along the growth axis. It also allows the separate and accurate determination of the SrTiO3 lattice parameter (c = 3.9214 ± 0.0003 Å) and the SrO–SrO inter-reticular distance (d = 2.549 ± 0.001 Å) in the RP structure.

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.