Volume 219, Issue 9 2270021
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Implementation of Nanoscale Secondary-Ion Mass Spectrometry Analyses: Application to Ni-Based Superalloys

Jean Almoric

Corresponding Author

Jean Almoric

Department Elaboration et MOdélisation pour les NAnotechnologies (EMONA), Institut Matériaux Microélectronique Nanoscience de Provence (IM2NP), 13397 Marseille, France

Orsay Physics, 13710 Fuveau, France

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Malik Durand

Malik Durand

Department Métallurgie, Microstructure, Rhéologie, MINES ParisTech - Centre de Mise en Forme des Matériaux (CEMEF), 06904 Sophia-Antipolis, France

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Anthony Seret

Anthony Seret

Department Métallurgie, Microstructure, Rhéologie, MINES ParisTech - Centre de Mise en Forme des Matériaux (CEMEF), 06904 Sophia-Antipolis, France

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Alexis Nicolaÿ

Alexis Nicolaÿ

Department Métallurgie, Microstructure, Rhéologie, MINES ParisTech - Centre de Mise en Forme des Matériaux (CEMEF), 06904 Sophia-Antipolis, France

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Arnaud Houel

Arnaud Houel

Orsay Physics, 13710 Fuveau, France

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Isabelle Berbezier

Isabelle Berbezier

Department Elaboration et MOdélisation pour les NAnotechnologies (EMONA), Institut Matériaux Microélectronique Nanoscience de Provence (IM2NP), 13397 Marseille, France

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Nathalie Bozzolo

Nathalie Bozzolo

Department Métallurgie, Microstructure, Rhéologie, MINES ParisTech - Centre de Mise en Forme des Matériaux (CEMEF), 06904 Sophia-Antipolis, France

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First published: 10 May 2022

Graphical Abstract

Nickel-Based Superalloys

Nickel-based superalloys are used in the manufacturing of aircraft engine parts and are widely studied for their outstanding mechanical resistance at high temperatures. In article number 2100414, Jean Almoric and co-workers carried out a chemical characterization at very high resolution (<30nm) of a γ-γ' alloy allowing a semi-quantification of γ' precipitates. This is achieved with an innovative orthogonal time-of-flight SIMS integrated in a Focused Ion Beam/Scanning Electron Microscope UHV platform, called NanoSpace and made by Orsay Physics.

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