Volume 220, Issue 16 2200848
Research Article

Novel Codoping Moiety to Achieve Enhanced P-Type Doping in GaN by Ion Implantation

Alan G. Jacobs

Corresponding Author

Alan G. Jacobs

Power Electronics and Advanced Materials Branch, United States Naval Research Laboratory, Washington, DC, 20375 USA

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Joseph A. Spencer

Joseph A. Spencer

Power Electronics and Advanced Materials Branch, United States Naval Research Laboratory, Washington, DC, 20375 USA

Materials Science and Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA, 24061 USA

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Jennifer K. Hite

Jennifer K. Hite

Power Electronics and Advanced Materials Branch, United States Naval Research Laboratory, Washington, DC, 20375 USA

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Karl D. Hobart

Karl D. Hobart

Power Electronics and Advanced Materials Branch, United States Naval Research Laboratory, Washington, DC, 20375 USA

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Travis J. Anderson

Travis J. Anderson

Power Electronics and Advanced Materials Branch, United States Naval Research Laboratory, Washington, DC, 20375 USA

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Boris N. Feigelson

Corresponding Author

Boris N. Feigelson

Power Electronics and Advanced Materials Branch, United States Naval Research Laboratory, Washington, DC, 20375 USA

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First published: 16 March 2023
Citations: 2

Abstract

Codoping of gallium nitride for improved acceptor ionization has long been theorized; however, reduction to practice proves difficult via growth. Herein, implementation of codoping via ion implantation and symmetric multicycle rapid thermal annealing utilizing magnesium codoped with silicon or oxygen is demonstrated. Results show enhanced photoluminescence with both donor species but with an order of magnitude greater increase with concurrent p-type hall for codoping with oxygen. Furthermore, the addition of nitrogen to balance stoichiometry suppresses defect photoluminescence signals. The incorporation of the donor and nitrogen demonstrates defect reduction beyond magnesium, only implants despite the additional implant dose and resultant damage with coimplantation. The enhanced hole concentrations evident with oxygen incorporation reveal important considerations for device design given unintentional doping during growth and future incorporation of ion implantation capabilities.

Conflict of Interest

The authors declare no conflicts of interest.

Data Availability Statement

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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