Volume 216, Issue 17 1970056
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Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential-Induced Degradation at the Rear Side

Kai Sporleder

Corresponding Author

Kai Sporleder

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

Faculty of Engineering, HTWK, Leipzig University of Applied Sciences, Karl-Liebknecht-Straße 134, 04277 Leipzig, Germany

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Volker Naumann

Volker Naumann

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

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Jan Bauer

Jan Bauer

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

Faculty EMW - Photovoltaic Technologies, Anhalt University of Applied Sciences, Bernburger Straße 55, 06366 Köthen, Germany

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Susanne Richter

Susanne Richter

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

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Angelika Hähnel

Angelika Hähnel

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

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Stephan Großer

Stephan Großer

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

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Marko Turek

Marko Turek

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

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Christian Hagendorf

Christian Hagendorf

Department Diagnostics and Metrology, Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Strasse 12, 06120 Halle, Germany

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First published: 11 September 2019
Citations: 4

Graphical Abstract

Industrial bifacial PERC solar cells show a new type of potential induced degradation (PID) at the rear side. After PID stress, cells exhibit power losses about 12 %rel. The origin of the losses is traced back to a local silicon corrosion, forming hole shaped damages within the passivation layers at the rear side. More details can be found in article number 1900334 by Kai Sporleder, Christian Hagendorf, and co-workers.

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