Volume 211, Issue 3 pp. 705-708
Original Paper

Rectifying behavior and photoinduced characteristic in La-doped BaSnO3/p-Si heterojunctions

B. C. Luo

Corresponding Author

B. C. Luo

Shaanxi Key Laboratory of Condensed Matter Structures and Properties, School of Science, Northwestern Polytechnical University, Xi'an, 710072 P. R., China

Corresponding author: e-mail [email protected], Phone: +86 29 88431670, Fax: +86 29 88431669Search for more papers by this author
J. Wang

J. Wang

Shaanxi Key Laboratory of Condensed Matter Structures and Properties, School of Science, Northwestern Polytechnical University, Xi'an, 710072 P. R., China

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X. S. Cao

X. S. Cao

School of Mathematics and Physics, Changzhou University, Changzhou, 213164 P. R., China

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K. X. Jin

K. X. Jin

Shaanxi Key Laboratory of Condensed Matter Structures and Properties, School of Science, Northwestern Polytechnical University, Xi'an, 710072 P. R., China

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First published: 13 December 2013
Citations: 7

Abstract

Photoinduced properties of Ba0.99La0.01SnO3/p-Si heterojunctions that exhibit rectifying characteristic have been investigated. It is found that the heterojunction shows particular photoinduced characteristics at reverse bias when illuminated by violet or green light. The photocurrent rises rapidly with reverse bias but saturates beyond a critical voltage under green light illumination, whereas the photocurrent shows a linear increase with reverse bias under violet light illumination. Given the experimental results, we attribute the observed photoinduced behavior to the balancing sequence of the width of the depleted layer and the penetration depth of the laser in the heterojunction.

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