Volume 31, Issue 11 pp. 1423-1427
Full Paper

Efficient Polymer Solar Cells Based on Solution-processed Vanadium Oxide as Hole-extracting Layer

Biao Xiao

Biao Xiao

Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou, Guangdong 510640, China

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Xiaoping Cheng

Xiaoping Cheng

Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou, Guangdong 510640, China

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Baofeng Zhao

Baofeng Zhao

Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou, Guangdong 510640, China

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Hongbin Wu

Corresponding Author

Hongbin Wu

Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou, Guangdong 510640, China

Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou, Guangdong 510640, China, Tel.: 0086-20-87114636-24; Fax: 0086-20-87110606Search for more papers by this author
First published: 14 November 2013
Citations: 2

Abstract

Here we reported the fabrication of efficient polymer solar cells from regioregular poly(3-hexylthiophene) (P3HT):fullerene derivative [6,6]-phenyl-C61 butyric acid methyl ester (PC61BM) mixtures, in which solution-processed vanadium oxide (VOx) was used as a hole-extracting layer (HEL). The obtained devices exhibited a high power conversion efficiency of 3.96%, and can be enhanced to 4.06% and 4.16%, respectively, when two types of PEDOT:PSS with different conductivities were used in conjunction with the VOx layer. All the VOx-based devices showed a high fill factor (FF) over 70%, which was ascribed to efficient hole extracting efficiency associated with the solution-processed VOx hole-extracting layer. The origins of the improvement were also studied by transmission spectra, atomic force microscope (AFM), and capacitance-voltage characteristics.

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