Establishing the Structural Integrity of Core–Shell Nanoparticles against Elemental Migration using Luminescent Lanthanide Probes
Bing Chen
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Search for more papers by this authorDr. Dengfeng Peng
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
Search for more papers by this authorXian Chen
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
Search for more papers by this authorProf. Xvsheng Qiao
State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Search for more papers by this authorProf. Xianping Fan
State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Search for more papers by this authorCorresponding Author
Prof. Feng Wang
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
City University of Hong Kong Shenzhen Research Institute, Shenzhen 518057 (China)
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)Search for more papers by this authorBing Chen
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Search for more papers by this authorDr. Dengfeng Peng
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
Search for more papers by this authorXian Chen
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
Search for more papers by this authorProf. Xvsheng Qiao
State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Search for more papers by this authorProf. Xianping Fan
State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Search for more papers by this authorCorresponding Author
Prof. Feng Wang
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)
City University of Hong Kong Shenzhen Research Institute, Shenzhen 518057 (China)
Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong SAR (China)Search for more papers by this authorAbstract
Core–shell structured nanoparticles are increasingly used to host luminescent lanthanide ions but the structural integrity of these nanoparticles still lacks sufficient understanding. Herein, we present a new approach to detect the diffusion of dopant ions in core–shell nanostructures using luminescent lanthanide probes whose emission profile and luminescence lifetime are sensitive to the chemical environment. We show that dopant ions in solution-synthesized core–shell nanoparticles are firmly confined in the designed locations. However, annealing at certain temperatures (greater than circa 350 °C) promotes diffusion of the dopant ions and leads to degradation of the integrity of the nanoparticles. These insights into core–shell nanostructures should enhance our ability to understand and use lanthanide-doped luminescent nanoparticles.
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