Volume 0, Issue 2 pp. 707-710
Original Paper

Impurity pairs and relaxation of excitation in silicon doped with group III and V impurities

Ya. E. Pokrovskii

Corresponding Author

Ya. E. Pokrovskii

Institute of Radioengineering and Electronics, Russian Academy of Sciences, 101999 Moscow, Russia

Phone: 095 203 4812, Fax: 095 203 8414Search for more papers by this author
N. A. Khvalkovskii

N. A. Khvalkovskii

Institute of Radioengineering and Electronics, Russian Academy of Sciences, 101999 Moscow, Russia

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First published: 27 January 2003
Citations: 1

Abstract

In Si doped with group III and V impurities at concentrations of 1016–1018 cm–3 infrared absorption bands of impurity pairs (IPs) appear and there is a slow relaxation of polarization hopping photoconductivity (PC) in a microwave (MCW) electric field. IPs create a broad spectrum of local states with ionization and excitation energies both lower and higher than those of single-impurity atoms. It is shown that ionization of IPs in compensated Si and a slow relaxation of re-charge after extrinsic excitation give a principal contribution to PC, due to hopping transitions of carriers between ionized and neutral impurity atoms in IPs induced by a MCW electric field.

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