Volume 75, Issue 2 pp. K129-K132
Short Note
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The degradation of semiconductor mechanical properties induced by microinclusions

G. V. Berenshtein

G. V. Berenshtein

Odessa State University

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A. M. Dyachenko

A. M. Dyachenko

Odessa State University

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I. E. Maronchuk

I. E. Maronchuk

Odessa State University

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First published: 16 February 1983

ul. Petra Velikogo 2, 270000 Odessa, USSR.

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