Volume 203, Issue 9 pp. 2151-2155
Original Paper

Structural properties of quaternary InAlGaN MQW grown by plasma-assisted MBE

G. P. Dimitrakopulos

Corresponding Author

G. P. Dimitrakopulos

Aristotle University of Thessaloniki, Department of Physics, Solid State Section, 541 24 Thessaloniki, Greece

Phone: +30 2310 998562, Fax: +30 2310 998589Search for more papers by this author
J. Kioseoglou

J. Kioseoglou

Aristotle University of Thessaloniki, Department of Physics, Solid State Section, 541 24 Thessaloniki, Greece

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E. Dimakis

E. Dimakis

Microelectronics Research Group, Department of Physics, University of Crete, Heraklion-Crete, Greece; and IESL, FORTH, P.O. Box 1527, 71110 Heraklion-Crete, Greece

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A. Georgakilas

A. Georgakilas

Microelectronics Research Group, Department of Physics, University of Crete, Heraklion-Crete, Greece; and IESL, FORTH, P.O. Box 1527, 71110 Heraklion-Crete, Greece

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G. Nouet

G. Nouet

SIFCOM, UMR CNRS 6176, ENSICAEN, 6, Boulevard du Maréchal Juin, 14050 Caen Cedex, France

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Ph. Komninou

Ph. Komninou

Aristotle University of Thessaloniki, Department of Physics, Solid State Section, 541 24 Thessaloniki, Greece

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First published: 10 July 2006

Abstract

Quaternary In0.085Al0.285Ga0.63N/GaN multiple quantum wells (MQW) grown by plasma-assisted molecular beam epitaxy are characterized by high resolution transmission electron microscopy (HRTEM), geometric phase analysis, and energy dispersive X-ray (EDX) nano-analysis. The MQW exhibit sharp well-defined InAlGaN/GaN interfaces while the GaN/InAlGaN interfaces are more smeared. The InAlGaN quantum wells and the GaN barriers are lattice-matched. Chemical distribution profiles are extracted from EDX line scans, obtained with a nanoprobe, which are compared to convoluted theoretical profiles, and are in good agreement with the HRTEM observations. Indium clustering occurs after prolonged observation under the electron beam. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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