Progress in Photovoltaics: Research and Applications
Volume 28, Issue 9 p. i
COVER IMAGE
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Cover Image

Chuanxiao Xiao, 

Chuanxiao Xiao

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Peter Hacke, 

Peter Hacke

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Steve Johnston, 

Steve Johnston

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Dana B. Sulas-Kern, 

Dana B. Sulas-Kern

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Chun-Sheng Jiang, 

Chun-Sheng Jiang

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Mowafak Al-Jassim, 

Mowafak Al-Jassim

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First published: 12 August 2020
https://doi.org/10.1002/pip.3324

Graphical Abstract

The cover image is based on the Research Article Failure analysis of field-failed bypass diodes by Chuanxiao Xiao et al., https://doi.org/10.1002/pip.3297.

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