Optik & Photonik
Volume 7, Issue 1 p. 21
Forschung & Technik
Free Access

Ultraschnelles Mikroskop misst elektrische Felder

Neues Analyse-Werkzeug für dynamische Prozesse könnte zu besseren Solarzellen und Sensoren führen

Jan Oliver Löfken, 

Jan Oliver Löfken

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First published: 20 February 2012
https://doi.org/10.1002/opph.201290008
No abstract is available for this article.

The full text of this article hosted at iucr.org is unavailable due to technical difficulties.