Diffuse X-ray scattering from polished silicon: application of the distorted wave Born approximation

Journal of Synchrotron Radiation Journal of

Synchrotron Radiation

IUCr IT WDC

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Figure 2

An image of the smooth sample obtained with an atomic force microscope.

JOURNAL OF

SYNCHROTRON

RADIATION

ISSN: 1600-5775

Volume 29| Part 2| March 2022| Pages 447-455

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