The Adaptive Gain Integrating Pixel Detector at the European XFEL

Allahgholi, A.; Becker, J.; Delfs, A.; Dinapoli, R.; Goettlicher, P.; Greiffenberg, D.; Henrich, B.; Hirsemann, H.; Kuhn, M.; Klanner, R.; Klyuev, A.; Krueger, H.; Lange, S.; Laurus, T.; Marras, A.; Mezza, D.; Mozzanica, A.; Niemann, M.; Poehlsen, J.; Schwandt, J.; Sheviakov, I.; Shi, X.; Smoljanin, S.; Steffen, L.; Sztuk-Dambietz, J.; Trunk, U.; Xia, Q.; Zeribi, M.; Zhang, J.; Zimmer, M.; Schmitt, B.; Graafsma, H.

doi:10.1107/S1600577518016077

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Figure 6

(a) Mean of 10000 pedestal and gain corrected X-ray images of a PCB. (b) AGIPD quadrants during mounting of FEMs. The imaged PCB is visible. (c) Mean of 30000 X-ray images of a pen drive after pedestal, gain and flat-field correction.

JOURNAL OF

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RADIATION

ISSN: 1600-5775

Volume 26| Part 1| January 2019| Pages 74-82

https://doi.org/10.1107/S1600577518016077

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