Combining synchrotron X-ray diffraction, mechanistic modeling and machine learning for in situ subsurface temperature quantification during laser melting

Lim, R.E.; Mukherjee, T.; Chuang, C.; Phan, T.Q.; DebRoy, T.; Pagan, D.C.

doi:10.1107/S1600576723005198

Journal of Applied Crystallography Journal of Applied

Crystallography

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Figure 10

Comparison of the evolution of temperature T metrics with time t, extracted from the experimental diffraction data using the GPR surrogate models.

JOURNAL OF

APPLIED

CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 56| Part 4| August 2023| Pages 1131-1143

https://doi.org/10.1107/S1600576723005198

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