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![[Figure 1]](https://journals.iucr.org/xx5027fig1mag.jpg)
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| Figure 1 A representative orientation map measured using electron backscatter diffraction from the thin-wall specimen tested in this work. Crystal directions are colored with respect to the build direction in the provided inverse-pole-figure color map. |
![[Figure 1]](https://journals.iucr.org/10.1107/S1600576723005198/xx5027fig1.jpg)
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JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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