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![[Figure 9]](https://journals.iucr.org/yr5104fig9mag.jpg)
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| Figure 9 (a) A realization of a JEOL 2010F schematic drawing in the software (Sarney, 2004  ). (b) A model of a generic SEM schematic drawing in the software (Steff, 2010). The sample in the TEM schematic drawing would be located inside the objective lens
but is not indicated on the schematic drawing. |
![[Figure 9]](https://journals.iucr.org/10.1107/S1600576723005174/yr5104fig9.jpg)
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JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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