Representative volume elements of strain/stress fields measured by diffraction techniques

Şeren, M.H.; Pagan, D.C.; Noyan, I.C.

doi:10.1107/S1600576723004351

Journal of Applied Crystallography Journal of Applied

Crystallography

IUCr IT WDC

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Figure 6

Computed $[\langle \varepsilon_{33}^{\prime} \rangle]$ versus $[\sin^2\psi]$ plot for all grains contributing to the 200 reflections of the edge-constrained W model subjected to a temperature increase of 70°C. For each ψ angle, all grains in the diffraction condition had identical $[\langle \varepsilon_{33}^{\prime} \rangle_\psi]$ . The exact same plot was obtained for all W reflections.