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![[Figure 2]](https://journals.iucr.org/jl5061fig2mag.jpg)
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| Figure 2 (a) Simulated rocking curve of GaAs/AlAs SL (blue), its convolution with the instrumental function (red) and the experimental data (black). (b) Cross-sectional SEM image of the corresponding SL with measured total SL thickness (tilt corrected). |
![[Figure 2]](https://journals.iucr.org/10.1107/S1600576723004302/jl5061fig2.jpg)
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JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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