Polymorphism and structure formation in copper phthalocyanine thin films

Reisz, B.; Belova, V.; Duva, G.; Zeiser, C.; Hodas, M.; Hagara, J.; Šiffalovič, P.; Pithan, L.; Hosokai, T.; Hinderhofer, A.; Gerlach, A.; Schreiber, F.

doi:10.1107/S1600576720015472

Journal of Applied Crystallography Journal of Applied

Crystallography

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Figure 2

In situ X-ray reflectivity (XRR) profiles: experimental data (black line), simulated data (red line) and corresponding SLD of electrons.

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ISSN: 1600-5767

Volume 54| Part 1| February 2021| Pages 203-210

https://doi.org/10.1107/S1600576720015472

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