SynchWeb: a modern interface for ISPyB

Fisher, S.J.; Levik, K.E.; Williams, M.A.; Ashton, A.W.; McAuley, K.E.

doi:10.1107/S1600576715004847

Journal of Applied Crystallography Journal of Applied

Crystallography

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Figure 4

Integration pipeline results from Fast DP and XIA2. A basic radiation damage analysis is given using XDSSTAT plotting R_d versus frame number difference.

JOURNAL OF

APPLIED

CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 48| Part 3| June 2015| Pages 927-932

https://doi.org/10.1107/S1600576715004847

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