A transparent two-dimensional in situ beam-position and profile monitor for synchrotron X-ray beamlines

Kyele, N.R.; Decanniere, K.; Silfhout, R.G. van

doi:10.1107/S0909049505031250

Journal of Synchrotron Radiation Journal of

Synchrotron Radiation

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Figure 7

The positional sensitivity of the device is measured by moving the device through the beam in steps of 10 µm and 100 µm (inset) in the vertical direction. The lower panel shows the best-fit residues.

JOURNAL OF

SYNCHROTRON

RADIATION

ISSN: 1600-5775

Volume 12| Part 6| October 2005| Pages 800-806

doi:10.1107/S0909049505031250

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